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Other articles related with "tunneling oxide degradation"：
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88502 |
Zhi-Yuan Lun(伦志远), Yun Li(李云), Kai Zhao(赵凯), Gang Du(杜刚), Xiao-Yan Liu(刘晓彦), Yi Wang(王漪) |
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Modeling of trap-assisted tunneling on performance of charge trapping memory with consideration of trap position and energy level |
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Chin. Phys. B
2016 Vol.25 (8): 88502-088502
[Abstract]
(700)
[HTML 1 KB]
[PDF 816 KB]
(569)
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